Search Results for Electronic apparatus and appliances -- Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronic$002bapparatus$002band$002bappliances$002b--$002bReliability.$0026ps$003d300?dt=list2024-11-28T07:56:05ZReliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Extreme environment electronicsent://SD_ILS/0/SD_ILS:2853032024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Cressler, John D. Mantooth, H. Alan, 1963-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439874318">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:3056902024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Bâzu, M. I. (Marius I.), 1948- Băjenescu, Titu I., 1938-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:2988172024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Pascoe, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structural dynamics of electronic and photonic systemsent://SD_ILS/0/SD_ILS:2987192024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Suhir, Ephraim. Yu, T. X. (Tongxi), 1941- Connally, Eric. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470950012">An electronic book accessible through the World Wide Web; click for information</a>
<a href="$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012">$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Parts selection and managementent://SD_ILS/0/SD_ILS:3017302024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Pecht, Michael.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1002/0471723886">Authentication may be required</a>
<a href="http://catdir.loc.gov/catdir/bios/wiley046/2004040698.html">Full text available from Wiley InterScience</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/54046845.html">http://catalog.hathitrust.org/api/volumes/oclc/54046845.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471723886">http://dx.doi.org/10.1002/0471723886</a>
Book review (E-STREAMS) <a href="http://www.e-streams.com/es0804/es0804_4027.html">http://www.e-streams.com/es0804/es0804_4027.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability of electronic equipment and productsent://SD_ILS/0/SD_ILS:2883622024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Hnatek, Eugene R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated stress testing handbook guide for achieving quality productsent://SD_ILS/0/SD_ILS:2496452024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Chan, H. Anthony, 1952- Englert, Paul J, 1960-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:2563092024-11-28T07:56:05Z2024-11-28T07:56:05ZAuthor Ohring, Milton, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>