Search Results for Electronic books - Narrowed by: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronic$002bbooks$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list 2024-12-23T02:15:18Z Probabilistic design for optimization and robustness for engineers ent://SD_ILS/0/SD_ILS:341796 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Dodson, Bryan, 1962- author.&#160;Hammett, Patrick C., author.&#160;Klerx, Rene, author.<br/>Preferred Shelf Number&#160;ONLINE(341796.1)<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a> ebrary <a href="http://alltitles.ebrary.com/Doc?id=10896040">http://alltitles.ebrary.com/Doc?id=10896040</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118796245">http://dx.doi.org/10.1002/9781118796245</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118796306">http://proquest.tech.safaribooksonline.de/9781118796306</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Klyatis, Lev M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Natvig, Bent, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Architecting resilient systems accident avoidance and survival and recovery from disruptions ent://SD_ILS/0/SD_ILS:297830 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Jackson, Scott.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Bauer, Eric.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Curtis, Peter M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Smith, David John, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Porter, Alex.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2024-12-23T02:15:18Z 2024-12-23T02:15:18Z Author&#160;Walker, N. Edward.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>