Search Results for Electronic circuits--Testing. - Narrowed by: Beytepe General CollectionSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronic$002bcircuits--Testing.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ABEYTEPEGEN$002509Beytepe$002bGeneral$002bCollection$0026ps$003d300?2024-10-24T06:21:26ZEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsent://SD_ILS/0/SD_ILS:3927322024-10-24T06:21:26Z2024-10-24T06:21:26ZAuthor Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Preferred Shelf Number TK7874.75 B87 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Advances in electronic testing : challenges and methodologiesent://SD_ILS/0/SD_ILS:1197122024-10-24T06:21:26Z2024-10-24T06:21:26ZAuthor Gizopoulos, Dimitris.<br/>Preferred Shelf Number TK7867 .A385 2006<br/>Format: Books<br/>Availability Beytepe Library~1<br/>