Search Results for Electronic circuits. - Narrowed by: Industrial safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronic$002bcircuits.$0026qf$003dSUBJECT$002509Subject$002509Industrial$002bsafety.$002509Industrial$002bsafety.$0026te$003dILS$0026ps$003d300? 2024-09-27T04:17:34Z The Electrical Contact of the Pantograph-Catenary System Theory and Application ent://SD_ILS/0/SD_ILS:483474 2024-09-27T04:17:34Z 2024-09-27T04:17:34Z Author&#160;Wu, Guangning. author.&#160;Gao, Guoqiang. author.&#160;Wei, Wenfu. author.&#160;Yang, Zefeng. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-13-6589-8">https://doi.org/10.1007/978-981-13-6589-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:484755 2024-09-27T04:17:34Z 2024-09-27T04:17:34Z Author&#160;Grasser, Tibor. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for Manufacturability From 1D to 4D for 90&ndash;22 nm Technology Nodes ent://SD_ILS/0/SD_ILS:488642 2024-09-27T04:17:34Z 2024-09-27T04:17:34Z Author&#160;Balasinski, Artur. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>