Search Results for Electronic. - Narrowed by: Systems engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronic.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026ps$003d300? 2024-11-14T12:16:17Z Soft Errors in Modern Electronic Systems ent://SD_ILS/0/SD_ILS:172744 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Nicolaidis, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic Devices for Analog Signal Processing ent://SD_ILS/0/SD_ILS:206293 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Rybin, Yu. K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2205-7">http://dx.doi.org/10.1007/978-94-007-2205-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Debugging at the Electronic System Level ent://SD_ILS/0/SD_ILS:205442 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Rogin, Frank. author.&#160;Drechsler, Rolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9255-7">http://dx.doi.org/10.1007/978-90-481-9255-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analog Electronic Filters Theory, Design and Synthesis ent://SD_ILS/0/SD_ILS:206288 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Dimopoulos, Hercules G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf 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2024-11-14T12:16:17Z Author&#160;Maichen, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-31419-8">http://dx.doi.org/10.1007/978-0-387-31419-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500&trade; ent://SD_ILS/0/SD_ILS:166049 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Silva, Francisco. author.&#160;McLaurin, Teresa. author.&#160;Waayers, Tom. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data Mining and Diagnosing IC Fails ent://SD_ILS/0/SD_ILS:165270 2024-11-14T12:16:17Z 2024-11-14T12:16:17Z Author&#160;Huisman, 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