Search Results for Electronics. - Narrowed by: Weights and measures.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectronics.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ps$003d300$0026isd$003dtrue?2024-09-27T13:26:02ZMultisensor Fusion and Integration for Intelligent Systems An Edition of the Selected Papers from the IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems 2008ent://SD_ILS/0/SD_ILS:1893462024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Hahn, Hernsoo. editor. Ko, Hanseok. editor. Lee, Sukhan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-89859-7">http://dx.doi.org/10.1007/978-3-540-89859-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Particle Detection with Drift Chambersent://SD_ILS/0/SD_ILS:1876542024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Rolandi, Luigi. author. Riegler, Werner. author. Blum, Walter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-76684-1">http://dx.doi.org/10.1007/978-3-540-76684-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:1702472024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement Uncertainty An Approach via the Mathematical Theory of Evidenceent://SD_ILS/0/SD_ILS:1663412024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Salicone, Simona. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Geomagnetics for Aeronautical Safety A Case Study in and around the Balkansent://SD_ILS/0/SD_ILS:1693502024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Rasson, Jean L. editor. Delipetrov, Todor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-5025-1">http://dx.doi.org/10.1007/978-1-4020-5025-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pixel Detectors From Fundamentals to Applicationsent://SD_ILS/0/SD_ILS:1817152024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Rossi, Leonardo. author. Fischer, Peter. author. Rohe, Tilman. author. Wermes, Norbert. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-28333-1">http://dx.doi.org/10.1007/3-540-28333-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGYent://SD_ILS/0/SD_ILS:1694122024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beam Instrumentation and Diagnosticsent://SD_ILS/0/SD_ILS:1807052024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Strehl, Peter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-26404-3">http://dx.doi.org/10.1007/3-540-26404-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dynamic Characterisation of Analogue-to-Digital Convertersent://SD_ILS/0/SD_ILS:1652092024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Dallet, Dominique. author. Silva, José Machado. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136458">http://dx.doi.org/10.1007/b136458</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Integrated Chemical Microsensor Systems in CMOS Technologyent://SD_ILS/0/SD_ILS:1813722024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscale Diagnostic Techniquesent://SD_ILS/0/SD_ILS:1807372024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Breuer, Kenneth S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic Noise and Interfering Signals Principles and Applicationsent://SD_ILS/0/SD_ILS:1807892024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Vasilescu, Gabriel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Intense Electron and Ion Beamsent://SD_ILS/0/SD_ILS:1818622024-09-27T13:26:02Z2024-09-27T13:26:02ZAuthor Molokovsky, Sergey Ivanovich. author. Sushkov, Aleksandr Danilovich. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-28812-0">http://dx.doi.org/10.1007/3-540-28812-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>