Search Results for Ellipsometry. - Narrowed by: SpringerLink (Online service)
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2024-11-20T08:18:30Z
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
2024-11-20T08:18:30Z
2024-11-20T08:18:30Z
Author Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333782.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
ent://SD_ILS/0/SD_ILS:184793
2024-11-20T08:18:30Z
2024-11-20T08:18:30Z
Author Schubert, Mathias. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b11964">http://dx.doi.org/10.1007/b11964</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>