Search Results for Ellipsometry. - Narrowed by: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEllipsometry.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300? 2026-02-25T21:43:02Z Handbook of ellipsometry ent://SD_ILS/0/SD_ILS:252064 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Tompkins, Harland G.&#160;Irene, Eugene A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514992">http://www.sciencedirect.com/science/book/9780815514992</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ellipsometry at the Nanoscale ent://SD_ILS/0/SD_ILS:333782 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Losurdo, Maria. editor.&#160;Hingerl, Kurt. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333782.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectroscopic ellipsometry principles and applications ent://SD_ILS/0/SD_ILS:296817 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Fujiwara, Hiroyuki.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060193">http://dx.doi.org/10.1002/9780470060193</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A user's guide to ellipsometry ent://SD_ILS/0/SD_ILS:257949 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Tompkins, Harland G.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126939507">http://www.sciencedirect.com/science/book/9780126939507</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ellipsometry of Functional Organic Surfaces and Films ent://SD_ILS/0/SD_ILS:530874 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Hinrichs, Karsten. editor.&#160;Eichhorn, Klaus-Jochen. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-642-40128-2">https://doi.org/10.1007/978-3-642-40128-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons ent://SD_ILS/0/SD_ILS:184793 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Schubert, Mathias. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b11964">http://dx.doi.org/10.1007/b11964</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Progress in adhesion and adhesives. Volume 8 ent://SD_ILS/0/SD_ILS:599350 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Mittal, K. L., 1945- editor.<br/>Preferred Shelf Number&#160;TA455 .A34 P76 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394238231">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394238231</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of optical metrology : principles and applications ent://SD_ILS/0/SD_ILS:540970 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Yoshizawa, Toru, 1939-<br/>Preferred Shelf Number&#160;QC367 .H36 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Biopolymers at interfaces : edited by Martin Malmsten. ent://SD_ILS/0/SD_ILS:544112 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Malmsten, Martin.<br/>Preferred Shelf Number&#160;QD547 .B56 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9780824747343">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook of silicon semiconductor metrology ent://SD_ILS/0/SD_ILS:547244 2026-02-25T21:43:02Z 2026-02-25T21:43:02Z Author&#160;Diebold, A. C. (Alain C.)<br/>Preferred Shelf Number&#160;TK7871.85 .H3337 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>