Search Results for Embedded computer systems -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEmbedded$002bcomputer$002bsystems$002b--$002bTesting.$0026te$003dILS$0026ps$003d300?2024-09-07T10:56:00ZIntelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedingsent://SD_ILS/0/SD_ILS:5184852024-09-07T10:56:00Z2024-09-07T10:56:00ZAuthor Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(518485.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Model-based testing for embedded systemsent://SD_ILS/0/SD_ILS:2861432024-09-07T10:56:00Z2024-09-07T10:56:00ZAuthor Zander, Justyna. Schieferdecker, Ina. Mosterman, Pieter J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439818473">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing complex and embedded systemsent://SD_ILS/0/SD_ILS:2888732024-09-07T10:56:00Z2024-09-07T10:56:00ZAuthor Pries, Kim H., 1955- Quigley, Jon M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439821411">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>