Search Results for Engineering (General) - Narrowed by: Reliability (Engineering)
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEngineering$002b$002528General$002529$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300?
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Architecting resilient systems
ent://SD_ILS/0/SD_ILS:599418
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Author Jackson, Scott, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Physics-Of-Healthy in Mechatronics.
ent://SD_ILS/0/SD_ILS:598146
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Author El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Preferred Shelf Number TA169 .E515 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications
ent://SD_ILS/0/SD_ILS:597447
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Author Zio, Enrico, author. Li, Yan-Fu, author.<br/>Preferred Shelf Number TA169 .Z57 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability for engineers
ent://SD_ILS/0/SD_ILS:565385
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Author Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Repairable systems reliability analysis : a comprehensive framework
ent://SD_ILS/0/SD_ILS:596328
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Author Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Preferred Shelf Number QA402 .R35 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Methods for reliability improvement and risk reduction
ent://SD_ILS/0/SD_ILS:594697
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Author Todinov, M. T., author.<br/>Preferred Shelf Number TA169 .T649 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering and services
ent://SD_ILS/0/SD_ILS:594657
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Author Jin, Tongdan, author.<br/>Preferred Shelf Number TS173 .J56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of maintained systems subjected to wear failure mechanisms : theory and applications
ent://SD_ILS/0/SD_ILS:595240
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Author Bayle, Franck, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving product reliability and software quality : strategies, tools, process and implementation
ent://SD_ILS/0/SD_ILS:595034
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Author Levin, Mark, 1959- author. Kalal, Ted T., author. Rodin, Jonathan, 1957- author.<br/>Preferred Shelf Number TS173 .L48 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors
ent://SD_ILS/0/SD_ILS:595289
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Author Xing, Liudong, author. Levitin, Gregory, author. Wang, Chaonan, 1986- author.<br/>Preferred Shelf Number TA169 .X56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Production availability and reliability : use in the oil and gas industry
ent://SD_ILS/0/SD_ILS:594494
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Author Leroy, Alain, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability analysis and prediction
ent://SD_ILS/0/SD_ILS:593807
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Author Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.<br/>Preferred Shelf Number TA656.5 .M45 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>