Search Results for Engineering -- Statistical methods - Narrowed by: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEngineering$002b--$002bStatistical$002bmethods$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ic$003dtrue$0026ps$003d300? 2026-01-22T20:43:20Z Simple statistical methods for software engineering : data and patterns ent://SD_ILS/0/SD_ILS:380133 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Pandian, C. Ravindranath, author.&#160;Kumar S. K., Murali, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439816622">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> R programming for mass spectrometry : effective and reproducible data analysis ent://SD_ILS/0/SD_ILS:599900 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Julian, Randall K., author.<br/>Preferred Shelf Number&#160;QD96 .M3 J85 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction for microelectronics ent://SD_ILS/0/SD_ILS:598968 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Bernstein, Joseph B., author.&#160;Bensoussan, Alain A., author.&#160;Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nonparametric statistics with applications to science and engineering with R ent://SD_ILS/0/SD_ILS:598011 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Kvam, Paul H., 1962- author.&#160;Vidakovic, Brani, 1955- author.&#160;Kim, Seong-joon, author.<br/>Preferred Shelf Number&#160;QA278.8 .V53 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A guide to virology for engineers and applied scientists : epidemiology, emergency management, and optimization ent://SD_ILS/0/SD_ILS:598115 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Reynolds, Megan M., author.&#160;Theodore, Louis, author.<br/>Preferred Shelf Number&#160;QR360 .R49 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability : approaches from perspectives of statistical moments ent://SD_ILS/0/SD_ILS:596358 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Zhao, Yan-Gang, author.&#160;Lu, Zhao-Hui, author.<br/>Preferred Shelf Number&#160;TA650 .Z53 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Industrial data analytics for diagnosis and prognosis : a random effects modelling approach ent://SD_ILS/0/SD_ILS:596574 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Zhou, Shiyu, 1970- author.&#160;Chen, Yong (Professor of industrial and systems engineering), author.<br/>Preferred Shelf Number&#160;T57.35 .Z56 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical learning for big dependent data ent://SD_ILS/0/SD_ILS:596296 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Pe&ntilde;a, Daniel, 1948- author.&#160;Tsay, Ruey S., 1951- author.<br/>Preferred Shelf Number&#160;QA76.9 .B45 P46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bird strike in aviation : statistics, analysis and management ent://SD_ILS/0/SD_ILS:595165 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;El-Sayed, Ahmed F., author.<br/>Preferred Shelf Number&#160;TL553.5 .E37 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:595173 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Liu, Yan, author.&#160;Abeyratne, Athula I., author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust statistics : theory and methods (with R) ent://SD_ILS/0/SD_ILS:594721 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Maronna, Ricardo A., author.&#160;Martin, R. Douglas, author.&#160;Yohai, V&iacute;ctor J., author.<br/>Preferred Shelf Number&#160;QA276 .M336 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Model identification and data analysis ent://SD_ILS/0/SD_ILS:594851 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Bittanti, Sergio, author.<br/>Preferred Shelf Number&#160;TA342 .B58 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analytic methods in systems and software testing ent://SD_ILS/0/SD_ILS:594482 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Kenett, Ron, editor.&#160;Ruggeri, Fabrizio, editor.&#160;Faltin, Frederick W., editor.<br/>Preferred Shelf Number&#160;QA76.76 .T48 A52 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> First hitting time regression models : lifetime data analysis based on underlying stochastic processes ent://SD_ILS/0/SD_ILS:593826 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Caroni, Chrysseis, author.<br/>Preferred Shelf Number&#160;QA278.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Bayesian estimation and copula models of dependence ent://SD_ILS/0/SD_ILS:593462 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Shemyakin, Arkady.&#160;Kniazev, Alexander (Mathematician)<br/>Preferred Shelf Number&#160;QA279.5 .S435 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics for process control engineers : a practical approach ent://SD_ILS/0/SD_ILS:593593 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;King, Myke, 1951-<br/>Preferred Shelf Number&#160;TS156.8 .K487 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Monitoring and control of information-poor systems ent://SD_ILS/0/SD_ILS:305497 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Dexter, A. L. (Arthur L.)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119945864">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=865034">Click here to view book</a> ebrary <a href="http://site.ebrary.com/id/10538662">http://site.ebrary.com/id/10538662</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10538662">http://site.ebrary.com/lib/alltitles/Doc?id=10538662</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced kalman filtering, least-squares and modeling a practical handbook ent://SD_ILS/0/SD_ILS:298482 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Gibbs, Bruce. P., 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=644860">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118003169">Available by subscription from Safari Books Online</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=40568">http://www.books24x7.com/marc.asp?bookid=40568</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470890042">http://dx.doi.org/10.1002/9780470890042</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446728">http://site.ebrary.com/lib/alltitles/Doc?id=10446728</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Random data analysis and measurement procedures ent://SD_ILS/0/SD_ILS:303809 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Bendat, Julius S.&#160;Piersol, Allan G.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118032428">http://onlinelibrary.wiley.com/book/10.1002/9781118032428</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=698703">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=698703</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780470248775">http://proquest.safaribooksonline.com/?fpi=9780470248775</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118032428">http://dx.doi.org/10.1002/9781118032428</a> <a href="http://proquest.safaribooksonline.com/9780470248775">http://proquest.safaribooksonline.com/9780470248775</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical design and analysis of experiments with applications to engineering and science ent://SD_ILS/0/SD_ILS:301511 2026-01-22T20:43:20Z 2026-01-22T20:43:20Z Author&#160;Mason, Robert L. (Robert Lee), 1946-&#160;Gunst, Richard F., 1947-&#160;Hess, James L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpSDAEWAE1">http://app.knovel.com/web/toc.v/cid:kpSDAEWAE1</a> John Wiley <a href="http://dx.doi.org/10.1002/0471458503">http://dx.doi.org/10.1002/0471458503</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley045/2002068951.html">http://catdir.loc.gov/catdir/bios/wiley045/2002068951.html</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=36621&ref=toc">http://www.myilibrary.com?id=36621&ref=toc</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=159825">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=159825</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>