Search Results for Engineering -- Statistical methods. - Narrowed by: Wiley E-Book Collection SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEngineering$002b--$002bStatistical$002bmethods.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AWILEY$002509Wiley$002bE-Book$002bCollection$0026ps$003d300? 2026-01-23T20:37:42Z R programming for mass spectrometry : effective and reproducible data analysis ent://SD_ILS/0/SD_ILS:599900 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Julian, Randall K., author.<br/>Preferred Shelf Number&#160;QD96 .M3 J85 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction for microelectronics ent://SD_ILS/0/SD_ILS:598968 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Bernstein, Joseph B., author.&#160;Bensoussan, Alain A., author.&#160;Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data analysis and related applications : new approaches. 4 ent://SD_ILS/0/SD_ILS:599385 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Dimotikalis, Yiannis, editor.&#160;Skiadas, Christos H., editor.<br/>Preferred Shelf Number&#160;QA276 .D38 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394316915">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394316915</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical modeling and simulation : introduction for scientists and engineers ent://SD_ILS/0/SD_ILS:599300 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Velten, Kai, author.&#160;Schmidt, Dominik M., author.&#160;Kahlen, Katrin, author.<br/>Preferred Shelf Number&#160;QA401 .V38 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527849604">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527849604</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nonparametric statistics with applications to science and engineering with R ent://SD_ILS/0/SD_ILS:598011 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Kvam, Paul H., 1962- author.&#160;Vidakovic, Brani, 1955- author.&#160;Kim, Seong-joon, author.<br/>Preferred Shelf Number&#160;QA278.8 .V53 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A guide to virology for engineers and applied scientists : epidemiology, emergency management, and optimization ent://SD_ILS/0/SD_ILS:598115 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Reynolds, Megan M., author.&#160;Theodore, Louis, author.<br/>Preferred Shelf Number&#160;QR360 .R49 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598306 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design of experiments for reliability achievement ent://SD_ILS/0/SD_ILS:597561 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Rigdon, Steven E., 1955- author.&#160;Pan, Rong (Professor of reliability engineering), author.&#160;Montgomery, Douglas C., author.&#160;Freeman, Laura June, author.<br/>Preferred Shelf Number&#160;TS173 .R54 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Sterile processing of pharmaceutical products : engineering practice, validation, and compliance in regulated environments ent://SD_ILS/0/SD_ILS:597332 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Hout, Sam, author.<br/>Preferred Shelf Number&#160;RS199 .S73<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119802358">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119802358</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability : approaches from perspectives of statistical moments ent://SD_ILS/0/SD_ILS:596358 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Zhao, Yan-Gang, author.&#160;Lu, Zhao-Hui, author.<br/>Preferred Shelf Number&#160;TA650 .Z53 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Industrial data analytics for diagnosis and prognosis : a random effects modelling approach ent://SD_ILS/0/SD_ILS:596574 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Zhou, Shiyu, 1970- author.&#160;Chen, Yong (Professor of industrial and systems engineering), author.<br/>Preferred Shelf Number&#160;T57.35 .Z56 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to statistical process control ent://SD_ILS/0/SD_ILS:596279 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Aslam, Muhammad.&#160;Saghir, Aamir.&#160;Ahmad, Liaquat.<br/>Preferred Shelf Number&#160;TS156.8<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119528425">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119528425</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical learning for big dependent data ent://SD_ILS/0/SD_ILS:596296 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Pe&ntilde;a, Daniel, 1948- author.&#160;Tsay, Ruey S., 1951- author.<br/>Preferred Shelf Number&#160;QA76.9 .B45 P46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:596471 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Kenett, Ron, author.&#160;Zacks, Shelemyahu, 1932- author.&#160;Amberti, Daniele, author.<br/>Preferred Shelf Number&#160;TS156 .K46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties ent://SD_ILS/0/SD_ILS:596531 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Dahoo, Pierre Richard.&#160;Pougnet, Philippe.&#160;El Hami, Abdelkhalak.<br/>Preferred Shelf Number&#160;QC88<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Molecular simulations : fundamentals and practice ent://SD_ILS/0/SD_ILS:596022 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Alavi, Saman.<br/>Preferred Shelf Number&#160;QC28<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699452">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699452</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust statistics : theory and methods (with R) ent://SD_ILS/0/SD_ILS:594721 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Maronna, Ricardo A., author.&#160;Martin, R. Douglas, author.&#160;Yohai, V&iacute;ctor J., author.<br/>Preferred Shelf Number&#160;QA276 .M336 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:595173 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Liu, Yan, author.&#160;Abeyratne, Athula I., author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Model identification and data analysis ent://SD_ILS/0/SD_ILS:594851 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Bittanti, Sergio, author.<br/>Preferred Shelf Number&#160;TA342 .B58 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bird strike in aviation : statistics, analysis and management ent://SD_ILS/0/SD_ILS:595165 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;El-Sayed, Ahmed F., author.<br/>Preferred Shelf Number&#160;TL553.5 .E37 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Joining of polymer-metal hybrid structures : principles and applications ent://SD_ILS/0/SD_ILS:594173 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Amancio Filho, Sergio T., 1976- editor.&#160;Blaga, Lucien-Attila, editor.<br/>Preferred Shelf Number&#160;TA664 .J65 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119429807">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119429807</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analytic methods in systems and software testing ent://SD_ILS/0/SD_ILS:594482 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Kenett, Ron, editor.&#160;Ruggeri, Fabrizio, editor.&#160;Faltin, Frederick W., editor.<br/>Preferred Shelf Number&#160;QA76.76 .T48 A52 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Bayesian way : introductory statistics for economists and engineers ent://SD_ILS/0/SD_ILS:594339 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Nyberg, Svein Olav, author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119246909">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119246909</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Bayesian estimation and copula models of dependence ent://SD_ILS/0/SD_ILS:593462 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Shemyakin, Arkady.&#160;Kniazev, Alexander (Mathematician)<br/>Preferred Shelf Number&#160;QA279.5 .S435 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to quantitative data analysis in the behavioral and social sciences ent://SD_ILS/0/SD_ILS:593470 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Albers, Michael J., editor<br/>Preferred Shelf Number&#160;QA76.9 .Q36<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119290384">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119290384</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics for process control engineers : a practical approach ent://SD_ILS/0/SD_ILS:593593 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;King, Myke, 1951-<br/>Preferred Shelf Number&#160;TS156.8 .K487 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> First hitting time regression models : lifetime data analysis based on underlying stochastic processes ent://SD_ILS/0/SD_ILS:593826 2026-01-23T20:37:42Z 2026-01-23T20:37:42Z Author&#160;Caroni, Chrysseis, author.<br/>Preferred Shelf Number&#160;QA278.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>