Search Results for Error analysis (Mathematics) - Narrowed by: Electronic LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dError$002banalysis$002b$002528Mathematics$002529$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-06-24T04:02:41ZA Graduate Introduction to Numerical Methods From the Viewpoint of Backward Error Analysisent://SD_ILS/0/SD_ILS:3324172024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Corless, Robert M. author. Fillion, Nicolas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332417.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8453-0">http://dx.doi.org/10.1007/978-1-4614-8453-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A student's guide to data and error analysisent://SD_ILS/0/SD_ILS:2788272024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Berendsen, Herman J. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:2851872024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Latent class analysis of survey errorent://SD_ILS/0/SD_ILS:2984862024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Biemer, Paul P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470891155">http://dx.doi.org/10.1002/9780470891155</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurements and their uncertainties a practical guide to modern error analysisent://SD_ILS/0/SD_ILS:2780702024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Hughes, Ifan, 1968- Hase, Thomas.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement error models, methods, and applicationsent://SD_ILS/0/SD_ILS:2906062024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Buonaccorsi, John P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420066586">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dealing with uncertainties a guide to error analysisent://SD_ILS/0/SD_ILS:1531792024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Drosg, Manfred.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Margins of error a study of reliability in survey measurementent://SD_ILS/0/SD_ILS:2969962024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering studentsent://SD_ILS/0/SD_ILS:2546832024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Akin, J. E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750667227">http://www.sciencedirect.com/science/book/9780750667227</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustmentsent://SD_ILS/0/SD_ILS:2901652024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Gustafson, Paul, 1968-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203502761">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement errors in surveysent://SD_ILS/0/SD_ILS:3003332024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Biemer, Paul P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150382">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509849">http://site.ebrary.com/lib/alltitles/Doc?id=10509849</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical bit error rate an estimation methodologyent://SD_ILS/0/SD_ILS:2497642024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Kartalopoulos, Stamatios V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Uncertain input data problems and the worst scenario methodent://SD_ILS/0/SD_ILS:2544032024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Hlaváček, Ivan, 1933- Chleboun, Jan. Babuška, Ivo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444514356">http://www.sciencedirect.com/science/book/9780444514356</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Data reconciliation & gross error detection an intelligent use of process dataent://SD_ILS/0/SD_ILS:2520382024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Narasimhan, Shankar. Jordache, Cornelius.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152552">http://www.sciencedirect.com/science/book/9780884152552</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A posteriori error estimation in finite element analysisent://SD_ILS/0/SD_ILS:3002802024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Ainsworth, Mark, 1965- Oden, J. Tinsley (John Tinsley), 1936- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118032824">An electronic book accessible through the World Wide Web; click for information</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00039915.html">http://catdir.loc.gov/catdir/bios/wiley043/00039915.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spatial error analysis a unified, application-oriented treatmentent://SD_ILS/0/SD_ILS:2496882024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Hsu, David Y., 1945- IEEE Aerospace and Electronic Systems Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273252">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273252</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A unified approach to the finite element method and error analysis proceduresent://SD_ILS/0/SD_ILS:2545422024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Dow, John O., 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122214400">http://www.sciencedirect.com/science/book/9780122214400</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spherical Near-field Antenna Measurementsent://SD_ILS/0/SD_ILS:2477952024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Hansen, J. E., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBEW026E">http://dx.doi.org/10.1049/PBEW026E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement error modelsent://SD_ILS/0/SD_ILS:2952502024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Fuller, Wayne A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316665">http://dx.doi.org/10.1002/9780470316665</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The mathematics of finite elements and Applications V MAFELAP 1984ent://SD_ILS/0/SD_ILS:2551962024-06-24T04:02:41Z2024-06-24T04:02:41ZAuthor Conference on the Mathematics of Finite Elements and Applications (5th : 1984 : Brunel University) Whiteman, J. R. (John Robert)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127472553">http://www.sciencedirect.com/science/book/9780127472553</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>