Search Results for Error analysis (Mathematics). - Narrowed by: English SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dError$002banalysis$002b$002528Mathematics$002529.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026te$003dILS$0026ps$003d300? 2024-11-14T12:08:17Z Codes, Cryptology and Information Security 4th International Conference, C2SI 2023, Rabat, Morocco, May 29-31, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520866 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;El Hajji, Said. editor.&#160;Mesnager, Sihem. editor.&#160;Souidi, El Mamoun. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(520866.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-33017-9">https://doi.org/10.1007/978-3-031-33017-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Graduate Introduction to Numerical Methods From the Viewpoint of Backward Error Analysis ent://SD_ILS/0/SD_ILS:332417 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Corless, Robert M. author.&#160;Fillion, Nicolas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332417.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-8453-0">http://dx.doi.org/10.1007/978-1-4614-8453-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transportation systems reliability and safety ent://SD_ILS/0/SD_ILS:285187 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A student's guide to data and error analysis ent://SD_ILS/0/SD_ILS:278827 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Berendsen, Herman J. C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurements and their uncertainties a practical guide to modern error analysis ent://SD_ILS/0/SD_ILS:278070 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Hughes, Ifan, 1968-&#160;Hase, Thomas.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement error models, methods, and applications ent://SD_ILS/0/SD_ILS:290606 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Buonaccorsi, John P.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420066586">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Latent class analysis of survey error ent://SD_ILS/0/SD_ILS:298486 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Biemer, Paul P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470891155">http://dx.doi.org/10.1002/9780470891155</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dealing with uncertainties a guide to error analysis ent://SD_ILS/0/SD_ILS:153179 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Drosg, Manfred.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Margins of error a study of reliability in survey measurement ent://SD_ILS/0/SD_ILS:296996 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Alwin, Duane F. (Duane Francis), 1944-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students ent://SD_ILS/0/SD_ILS:254683 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Akin, J. E.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750667227">http://www.sciencedirect.com/science/book/9780750667227</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement errors in surveys ent://SD_ILS/0/SD_ILS:300333 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Biemer, Paul P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150382">An electronic book accessible through the World Wide Web; click for information</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0626/2005270829-b.html">http://catdir.loc.gov/catdir/enhancements/fy0626/2005270829-b.html</a> ebrary <a href="http://site.ebrary.com/id/10509849">http://site.ebrary.com/id/10509849</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509849">http://site.ebrary.com/lib/alltitles/Doc?id=10509849</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments ent://SD_ILS/0/SD_ILS:290165 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Gustafson, Paul, 1968-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203502761">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Uncertain input data problems and the worst scenario method ent://SD_ILS/0/SD_ILS:254403 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Hlav&aacute;&#269;ek, Ivan, 1933-&#160;Chleboun, Jan.&#160;Babu&scaron;ka, Ivo.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444514356">http://www.sciencedirect.com/science/book/9780444514356</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical bit error rate : an estimation methodology ent://SD_ILS/0/SD_ILS:119480 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Kartalopoulos, Stamatios V.<br/>Preferred Shelf Number&#160;TK5103.59 K363 2004<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Data reduction and error analysis for the physical sciences ent://SD_ILS/0/SD_ILS:78237 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Bevington, Philip R., 1933-&#160;Robinson, D. Keith, ort. yaz.<br/>Preferred Shelf Number&#160;QA 278 B48 2003<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> A posteriori error estimation in finite element analysis ent://SD_ILS/0/SD_ILS:300280 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Ainsworth, Mark, 1965-&#160;Oden, J. Tinsley (John Tinsley), 1936-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118032824">An electronic book accessible through the World Wide Web; click for information</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00039915.html">http://catdir.loc.gov/catdir/bios/wiley043/00039915.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data reconciliation &amp; gross error detection an intelligent use of process data ent://SD_ILS/0/SD_ILS:252038 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Narasimhan, Shankar.&#160;Jordache, Cornelius.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152552">http://www.sciencedirect.com/science/book/9780884152552</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A unified approach to the finite element method and error analysis procedures ent://SD_ILS/0/SD_ILS:254542 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Dow, John O., 1941-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122214400">http://www.sciencedirect.com/science/book/9780122214400</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An introduction to error analysis : The study of uncertainties in physical measurements ent://SD_ILS/0/SD_ILS:79069 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Taylor, John Robert, 1939-<br/>Preferred Shelf Number&#160;QC 39 T4 1997<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Spherical Near-field Antenna Measurements ent://SD_ILS/0/SD_ILS:247795 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Hansen, J. E., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBEW026E">http://dx.doi.org/10.1049/PBEW026E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement error models ent://SD_ILS/0/SD_ILS:295250 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Fuller, Wayne A.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316665">http://dx.doi.org/10.1002/9780470316665</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The mathematics of finite elements and Applications V MAFELAP 1984 ent://SD_ILS/0/SD_ILS:255196 2024-11-14T12:08:17Z 2024-11-14T12:08:17Z Author&#160;Conference on the Mathematics of Finite Elements and Applications (5th : 1984 : Brunel University)&#160;Whiteman, J. 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