Search Results for Error. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dError.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-24T17:22:02ZMeasurement error modelsent://SD_ILS/0/SD_ILS:2952502024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Fuller, Wayne A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316665">http://dx.doi.org/10.1002/9780470316665</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Understanding Error Control Codingent://SD_ILS/0/SD_ILS:4826752024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Sanvicente, Emilio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-05840-1">https://doi.org/10.1007/978-3-030-05840-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Generalized Gaussian Error Calculusent://SD_ILS/0/SD_ILS:1905832024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Grabe, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03305-6">http://dx.doi.org/10.1007/978-3-642-03305-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Minimum Error Entropy Classificationent://SD_ILS/0/SD_ILS:3332192024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Marques de Sá, Joaquim P. author. Silva, Luís M.A. author. Santos, Jorge M.F. author. Alexandre, Luís A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333219.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29029-9">http://dx.doi.org/10.1007/978-3-642-29029-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Essentials of error-control codingent://SD_ILS/0/SD_ILS:2967442024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Castiñeira Moreira, Jorge. Farrell, Patrick G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=18371">http://www.books24x7.com/marc.asp?bookid=18371</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470035726">http://dx.doi.org/10.1002/9780470035726</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Estimates for Advanced Galerkin Methodsent://SD_ILS/0/SD_ILS:4854292024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Rüter, Marcus Olavi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-06173-9">https://doi.org/10.1007/978-3-030-06173-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Linear Network Error Correction Codingent://SD_ILS/0/SD_ILS:4851382024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Guang, Xuan. author. Zhang, Zhen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-0588-1">https://doi.org/10.1007/978-1-4939-0588-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement error models, methods, and applicationsent://SD_ILS/0/SD_ILS:2906062024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Buonaccorsi, John P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420066586">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Analysis with Applications in Engineeringent://SD_ILS/0/SD_ILS:2051192024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Kotulski, Zbigniew A. author. Szczepinski, Wojciech. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3570-7">http://dx.doi.org/10.1007/978-90-481-3570-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Latent class analysis of survey errorent://SD_ILS/0/SD_ILS:2984862024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Biemer, Paul P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470891155">http://dx.doi.org/10.1002/9780470891155</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human error causes and controlent://SD_ILS/0/SD_ILS:2884202024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Peters, George A., 1924- Peters, Barbara J., 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420008111">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The art of error correcting codingent://SD_ILS/0/SD_ILS:2967432024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Morelos-Zaragoza, Robert H.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=51916&ref=toc">http://www.myilibrary.com?id=51916&ref=toc</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470035706">http://dx.doi.org/10.1002/0470035706</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The art of error correcting codingent://SD_ILS/0/SD_ILS:3010372024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Morelos-Zaragoza, Robert H. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1002/0470847824">Authentication may be required:</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer control and human errorent://SD_ILS/0/SD_ILS:2547902024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Kletz, Trevor A. Chung, Paul S., 1958- Broomfield, Eamon. Shen-Orr, Chaim.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152699">http://www.sciencedirect.com/science/book/9780884152699</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory of error-correcting codesent://SD_ILS/0/SD_ILS:2573272024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor MacWilliams, F. J. (Florence Jessie), 1917- Sloane, N. J. A. (Neil James Alexander), 1939-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444850102">http://www.sciencedirect.com/science/book/9780444850102</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Reduction and Prevention in Surgical Pathologyent://SD_ILS/0/SD_ILS:4860672024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Nakhleh, Raouf E. editor. Volmar, Keith E. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18464-3">https://doi.org/10.1007/978-3-030-18464-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Reduction and Prevention in Surgical Pathologyent://SD_ILS/0/SD_ILS:5197372024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Nakhleh, Raouf E. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519737.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-2339-7">https://doi.org/10.1007/978-1-4939-2339-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and human error in engineering systemsent://SD_ILS/0/SD_ILS:2881262024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466506954">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Immunity to Error through Misidentification New Essaysent://SD_ILS/0/SD_ILS:2353002024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Prosser, Simon. Recanati, François.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9781139043274">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Control for Network-on-Chip Linksent://SD_ILS/0/SD_ILS:1731782024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9313-7">http://dx.doi.org/10.1007/978-1-4419-9313-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human error : species--being and media machinesent://SD_ILS/0/SD_ILS:3755732024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Pettman, Dominic.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.jstor.org/stable/10.5749/j.ctttv9w2">http://www.jstor.org/stable/10.5749/j.ctttv9w2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Huang, J. C., 1935-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Correction Codes for Non-Volatile Memoriesent://SD_ILS/0/SD_ILS:1701482024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Micheloni, R. author. Marelli, A. author. Ravasio, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8391-4">http://dx.doi.org/10.1007/978-1-4020-8391-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond human error taxonomies and safety scienceent://SD_ILS/0/SD_ILS:2910572024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Wallace, Brendan. Ross, Alastair, 1966-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203491171">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error correction coding mathematical methods and algorithmsent://SD_ILS/0/SD_ILS:3017782024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Moon, Todd K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={55C86E19-E672-472E-9E82-46506266B334}&Format=50">Click for information</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780471739210">http://dx.doi.org/10.1002/9780471739210</a>
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International Conference, BDA 2023, Delhi, India, December 7-9, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213612024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Goyal, Vikram. editor. Kumar, Naveen. editor. Bhowmick, Sourav S. editor. Goyal, Pawan. editor. Goyal, Navneet. editor.<br/>Preferred Shelf Number XX(521361.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-49601-1">https://doi.org/10.1007/978-3-031-49601-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Neural Information Processing 29th International Conference, ICONIP 2022, Virtual Event, November 22-26, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213882024-12-24T17:22:02Z2024-12-24T17:22:02ZAuthor Tanveer, Mohammad. editor. Agarwal, Sonali. editor. Ozawa, Seiichi. editor. Ekbal, Asif. editor. Jatowt, Adam. editor.<br/>Preferred Shelf Number XX(521388.1)<br/>Electronic Access <a 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