Search Results for Error. - Narrowed by: Engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dError.$0026qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026ps$003d300$0026isd$003dtrue?2025-12-28T01:37:47ZGeneralized Gaussian Error Calculusent://SD_ILS/0/SD_ILS:1905832025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Grabe, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03305-6">http://dx.doi.org/10.1007/978-3-642-03305-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Minimum Error Entropy Classificationent://SD_ILS/0/SD_ILS:3332192025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Marques de Sá, Joaquim P. author. Silva, Luís M.A. author. Santos, Jorge M.F. author. Alexandre, Luís A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333219.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29029-9">http://dx.doi.org/10.1007/978-3-642-29029-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Analysis with Applications in Engineeringent://SD_ILS/0/SD_ILS:2051192025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Kotulski, Zbigniew A. author. Szczepinski, Wojciech. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3570-7">http://dx.doi.org/10.1007/978-90-481-3570-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Control for Network-on-Chip Linksent://SD_ILS/0/SD_ILS:1731782025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9313-7">http://dx.doi.org/10.1007/978-1-4419-9313-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Error Correction Codes for Non-Volatile Memoriesent://SD_ILS/0/SD_ILS:1701482025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Micheloni, R. author. Marelli, A. author. Ravasio, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8391-4">http://dx.doi.org/10.1007/978-1-4020-8391-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USAent://SD_ILS/0/SD_ILS:4018302025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approachent://SD_ILS/0/SD_ILS:1734522025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2470-2">http://dx.doi.org/10.1007/978-1-4471-2470-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transient and Permanent Error Control for Networks-on-Chipent://SD_ILS/0/SD_ILS:1738192025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Yu, Qiaoyan. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0962-5">http://dx.doi.org/10.1007/978-1-4614-0962-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom Error Analysis and Practical Designent://SD_ILS/0/SD_ILS:1692762025-12-28T01:37:47Z2025-12-28T01:37:47ZAuthor Río, R. del. author. Medeiro, F. author. Pérez-Verdú, B. author. Rosa, J. M. author. Rodríguez-V´zquez, Á. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4776-2">http://dx.doi.org/10.1007/1-4020-4776-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>