Search Results for Failure time data analysis. - Narrowed by: Electronic Library
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The statistical analysis of failure time data
ent://SD_ILS/0/SD_ILS:301855
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Author Kalbfleisch, J. D. Prentice, Ross L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708259">http://swb.eblib.com/patron/FullRecord.aspx?p=708259</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Statistical Analysis of Interval-censored Failure Time Data
ent://SD_ILS/0/SD_ILS:166194
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Author Sun, Jianguo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37119-2">http://dx.doi.org/10.1007/0-387-37119-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
International Joint Conference 16th International Conference on Computational Intelligence in Security for Information Systems (CISIS 2023) 14th International Conference on EUropean Transnational Education (ICEUTE 2023) Proceedings
ent://SD_ILS/0/SD_ILS:529123
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Author García Bringas, Pablo. editor. Pérez García, Hilde. editor. (orcid)0000-0001-7112-1983 Martínez de Pisón, Francisco Javier. editor. (orcid)0000-0002-3063-7374 Martínez Álvarez, Francisco. editor. Troncoso Lora, Alicia. editor. (orcid)0000-0002-9801-7999<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-42519-6">https://doi.org/10.1007/978-3-031-42519-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Data Management, Analytics and Innovation Proceedings of ICDMAI 2023
ent://SD_ILS/0/SD_ILS:527734
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Author Sharma, Neha. editor. Goje, Amol. editor. Chakrabarti, Amlan. editor. Bruckstein, Alfred M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-1414-2">https://doi.org/10.1007/978-981-99-1414-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Internet, Data & Web Technologies The 11th International Conference on Emerging Internet, Data & Web Technologies (EIDWT-2023)
ent://SD_ILS/0/SD_ILS:528394
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Author Barolli, Leonard. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26281-4">https://doi.org/10.1007/978-3-031-26281-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Dependable Computer Systems and Networks Proceedings of the Eighteenth International Conference on Dependability of Computer Systems DepCoS-RELCOMEX, July 3-7, 2023, Brunów, Poland
ent://SD_ILS/0/SD_ILS:529025
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Author Zamojski, Wojciech. editor. Mazurkiewicz, Jacek. editor. Sugier, Jarosław. editor. Walkowiak, Tomasz. editor. Kacprzyk, Janusz. editor. (orcid)0000-0003-4187-5877<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-37720-4">https://doi.org/10.1007/978-3-031-37720-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papers
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Author Wen, Shiping. editor. Yang, Cihui. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-25191-7">https://doi.org/10.1007/978-3-031-25191-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
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Author Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Neuroengineering
ent://SD_ILS/0/SD_ILS:528210
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Author Thakor, Nitish V. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-16-5540-1">https://doi.org/10.1007/978-981-16-5540-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems
ent://SD_ILS/0/SD_ILS:529277
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Author Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceedings of the 7th World Congress on Engineering Asset Management (WCEAM 2012)
ent://SD_ILS/0/SD_ILS:530518
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Author Lee, Woo Bang. editor. Choi, Byeongkuen. editor. Ma, Lin. editor. Mathew, Joseph. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06966-1">https://doi.org/10.1007/978-3-319-06966-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mathematical methods in survival analysis, reliability and quality of life
ent://SD_ILS/0/SD_ILS:297543
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Author Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Counting processes and survival analysis
ent://SD_ILS/0/SD_ILS:300344
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Author Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a>
Spis tre?ci <a href="http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html">http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated testing and validation testing, engineering, and management tools for lean development
ent://SD_ILS/0/SD_ILS:254184
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Author Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical methods for survival data analysis
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Author Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139">http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical models and methods for lifetime data
ent://SD_ILS/0/SD_ILS:301856
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Author Lawless, Jerald F., 1944-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Environmental requirements for electromechanical and electronic equipment
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Author Tricker, Ray. Tricker, Samantha.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750639026">http://www.sciencedirect.com/science/book/9780750639026</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated testing statistical models, test plans and data analyses
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Author Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>