Search Results for Failure time data analysis. - Narrowed by: Electronic Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dFailure$002btime$002bdata$002banalysis.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026te$003dILS$0026ps$003d300? 2024-09-21T14:20:01Z The statistical analysis of failure time data ent://SD_ILS/0/SD_ILS:301855 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Kalbfleisch, J. D.&#160;Prentice, Ross L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708259">http://swb.eblib.com/patron/FullRecord.aspx?p=708259</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Statistical Analysis of Interval-censored Failure Time Data ent://SD_ILS/0/SD_ILS:166194 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Sun, Jianguo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37119-2">http://dx.doi.org/10.1007/0-387-37119-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papers ent://SD_ILS/0/SD_ILS:520804 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Wen, Shiping. editor.&#160;Yang, Cihui. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(520804.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-25191-7">https://doi.org/10.1007/978-3-031-25191-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interval-censored time-to-event data methods and applications ent://SD_ILS/0/SD_ILS:286242 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Chen, Ding-Geng.&#160;Sun, Jianguo, 1961-&#160;Peace, Karl E., 1941-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466504288">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multivariate survival analysis and competing risks ent://SD_ILS/0/SD_ILS:291624 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Crowder, M. J. (Martin J.), 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439875223">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Frailty models in survival analysis ent://SD_ILS/0/SD_ILS:287882 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Wienke, Andreas.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420073911">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical methods in survival analysis, reliability and quality of life ent://SD_ILS/0/SD_ILS:297543 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Huber, Catherine.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Counting processes and survival analysis ent://SD_ILS/0/SD_ILS:300344 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Fleming, Thomas R.&#160;Harrington, David P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a> Spis tre?ci <a href="http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html">http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html</a> ebrary <a href="http://site.ebrary.com/id/10509867">http://site.ebrary.com/id/10509867</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Porter, Alex.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical methods for survival data analysis ent://SD_ILS/0/SD_ILS:301512 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Lee, Elisa T.&#160;Wang, John Wenyu.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139">http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical models and methods for lifetime data ent://SD_ILS/0/SD_ILS:301856 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Lawless, Jerald F., 1944-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Classical competing risks ent://SD_ILS/0/SD_ILS:288593 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Crowder, M. J. (Martin J.), 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420035902">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Subjective probability models for lifetimes ent://SD_ILS/0/SD_ILS:290501 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Spizzichino, F. (Fabio), 1948-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036138">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Environmental requirements for electromechanical and electronic equipment ent://SD_ILS/0/SD_ILS:254339 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Tricker, Ray.&#160;Tricker, Samantha.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750639026">http://www.sciencedirect.com/science/book/9780750639026</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2024-09-21T14:20:01Z 2024-09-21T14:20:01Z Author&#160;Nelson, Wayne, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>