Search Results for Failure time data analysis. - Narrowed by: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dFailure$002btime$002bdata$002banalysis.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300? 2026-05-08T09:47:05Z The statistical analysis of failure time data ent://SD_ILS/0/SD_ILS:301855 2026-05-08T09:47:05Z 2026-05-08T09:47:05Z Author&#160;Kalbfleisch, J. D.&#160;Prentice, Ross L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708259">http://swb.eblib.com/patron/FullRecord.aspx?p=708259</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated life testing of one-shot devices : data collection and analysis ent://SD_ILS/0/SD_ILS:596340 2026-05-08T09:47:05Z 2026-05-08T09:47:05Z Author&#160;Balakrishnan, N., 1956- author.&#160;Ling, Man Ho, author.&#160;So, Hon Yiu, author.<br/>Preferred Shelf Number&#160;TA169.3 .B35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Chi-squared goodness-of-fit tests for censored data ent://SD_ILS/0/SD_ILS:593787 2026-05-08T09:47:05Z 2026-05-08T09:47:05Z Author&#160;Nikulin, M. S. (Mikhail Stepanovich), author.&#160;Chimitova, Ekaterina V., author.<br/>Preferred Shelf Number&#160;QA277.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Counting processes and survival analysis ent://SD_ILS/0/SD_ILS:300344 2026-05-08T09:47:05Z 2026-05-08T09:47:05Z Author&#160;Fleming, Thomas R.&#160;Harrington, David P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a> Spis tre?ci <a href="http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html">http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html</a> ebrary <a href="http://site.ebrary.com/id/10509867">http://site.ebrary.com/id/10509867</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>