Search Results for Failure time data analysis. - Narrowed by: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dFailure$002btime$002bdata$002banalysis.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300$0026isd$003dtrue?2026-01-01T19:15:01ZPractical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:5471962026-01-01T19:15:01Z2026-01-01T19:15:01ZAuthor Wessels, William R., author.<br/>Preferred Shelf Number TS173 .W45 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842026-01-01T19:15:01Z2026-01-01T19:15:01ZAuthor Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542026-01-01T19:15:01Z2026-01-01T19:15:01ZAuthor LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>