Search Results for Fault location (Engineering) - Narrowed by: English SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dFault$002blocation$002b$002528Engineering$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026pe$003dd$00253A$0026ps$003d300?dt=list 2026-01-18T00:52:57Z DATA-DRIVEN FAULT DIAGNOSIS a machine learning approach for industrial components. ent://SD_ILS/0/SD_ILS:559184 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;VASHISHTHA, GOVIND.<br/>Preferred Shelf Number&#160;Q325.5<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003614821">https://www.taylorfrancis.com/books/9781003614821</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> INTELLIGENT MACHINERY FAULT DIAGNOSTICS AND PROGNOSTICS the future of smart manufacturing ent://SD_ILS/0/SD_ILS:585181 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Goyal, Deepam editor&#160;Sharma, Ankit (Professor of mechanical engineering), editor.&#160;Abou Houran, Mohamad editor<br/>Preferred Shelf Number&#160;TJ174<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003480822">https://www.taylorfrancis.com/books/9781003480822</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Filter design for system modeling, state estimation and fault diagnosis ent://SD_ILS/0/SD_ILS:550168 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Wang, Ziyun, 1989- author.&#160;Wang, Yan, 1978- author.&#160;Ji, Zhicheng, 1959- author.<br/>Preferred Shelf Number&#160;TA168<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003327219">https://www.taylorfrancis.com/books/9781003327219</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Filter-based fault diagnosis and remaining useful prediction ent://SD_ILS/0/SD_ILS:551175 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Zhang, Yong, author.&#160;Wang, Zidong, 1966- author.&#160;Yuan, Ye, author.<br/>Preferred Shelf Number&#160;TA169.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003330998">https://www.taylorfrancis.com/books/9781003330998</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> State estimation and fault diagnosis under imperfect measurements ent://SD_ILS/0/SD_ILS:561796 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Liu, Yang (College teacher), author.&#160;Wang, Zidong, 1966- author.&#160;Zhou, Donghua, author.<br/>Preferred Shelf Number&#160;QA402.3<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309482">https://www.taylorfrancis.com/books/9781003309482</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine learning-based fault diagnosis for industrial engineering systems ent://SD_ILS/0/SD_ILS:560725 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Yang, Rui (Professor of computer engineering), author.&#160;Zhong, Maiying, author.<br/>Preferred Shelf Number&#160;TA169.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003240754">https://www.taylorfrancis.com/books/9781003240754</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling with information measures ent://SD_ILS/0/SD_ILS:562731 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Nair, N. Unnikrishnan, 1945- author.&#160;Sunoj, S. M., 1972- author.&#160;Rajesh, G., 1971- author.<br/>Preferred Shelf Number&#160;TA169 .N3526 2022 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Intelligent fault diagnosis and accommodation control ent://SD_ILS/0/SD_ILS:581595 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Huang, Sunan, 1962- author.&#160;Tan, Kok Kiong, 1967- author.&#160;Poi Voon Er, author.&#160;Lee, Tong Heng, 1958- author.<br/>Preferred Shelf Number&#160;TA169.6 .H83 2020 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429263880">https://www.taylorfrancis.com/books/9780429263880</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced condition monitoring and fault diagnosis of electric machines ent://SD_ILS/0/SD_ILS:481897 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Irfan, Muhammad, editor.&#160;IGI Global, publisher.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-5225-6989-3">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-5225-6989-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of measurement in science and engineering. Volume 3 ent://SD_ILS/0/SD_ILS:387126 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Kutz, Myer, editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1002/9781119244752">Wiley Online Library</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Self-healing systems and wireless networks management ent://SD_ILS/0/SD_ILS:540721 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Chaudhry, Junaid Ahsenali, author.<br/>Preferred Shelf Number&#160;TK5103.2 .C45156 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466556492">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Optimal automated process fault analysis ent://SD_ILS/0/SD_ILS:305287 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Fickelscherer, Richard J.&#160;Chester, Daniel L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1092858">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1092858</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481950">http://dx.doi.org/10.1002/9781118481950</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Gas turbine diagnostics : signal processing and fault isolation ent://SD_ILS/0/SD_ILS:544804 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Ganguli, Ranjan., author.<br/>Preferred Shelf Number&#160;TL709 .G33 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466502819">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Structural identification and damage detection using genetic algorithms ent://SD_ILS/0/SD_ILS:546581 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Koh, Chan Ghee.&#160;Perry, M. J. (Michael J.), 1981-<br/>Preferred Shelf Number&#160;TA646 .K56 2010 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780415876292">https://www.taylorfrancis.com/books/e/9780415876292</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367806187">https://www.taylorfrancis.com/books/9780367806187</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Condition Assessment of High Voltage Insulation in Power System Equipment ent://SD_ILS/0/SD_ILS:247914 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;James, R. E.&#160;Su, Q.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBPO053E">http://dx.doi.org/10.1049/PBPO053E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault detection, supervision and safety of technical processes 2006 a proceedings volume from the 6th IFAC symposium, SAFEPROCESS, Beijing, P.R. China, August 30-September 1, 2006 ent://SD_ILS/0/SD_ILS:145921 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;IFAC Symposium on Fault Detection, Supervision, and Safety for Technical Processes (6th : 2006 : Beijing, China)&#160;Zhang, Hong-Yue.&#160;International Federation of Automatic Control.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444857">http://www.sciencedirect.com/science/book/9780080444857</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Intelligent fault diagnosis and prognosis for engineering systems ent://SD_ILS/0/SD_ILS:119476 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Vachtsevanos, George.<br/>Preferred Shelf Number&#160;TA169.6 .I68 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Intelligent fault diagnosis and prognosis for engineering systems ent://SD_ILS/0/SD_ILS:296923 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Vachtsevanos, George J.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117842">http://dx.doi.org/10.1002/9780470117842</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Plastic pipe systems failure investigation and diagnosis ent://SD_ILS/0/SD_ILS:254776 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Farsh&#257;d, Mahd&#299;.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781856174961">http://www.sciencedirect.com/science/book/9781856174961</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Intelligent Control Systems using Computational Intelligence Techniques ent://SD_ILS/0/SD_ILS:247723 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Ruano, A. E., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBCE070E">http://dx.doi.org/10.1049/PBCE070E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Control Engineering Solutions A practical approach ent://SD_ILS/0/SD_ILS:247707 2026-01-18T00:52:57Z 2026-01-18T00:52:57Z Author&#160;Albertos, P., ed.&#160;Strietzel, R., ed.&#160;Mort, N., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBCE054E">http://dx.doi.org/10.1049/PBCE054E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>