Search Results for Fuchs, Harald. - Narrowed by: Nanotechnology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dFuchs$00252C$002bHarald.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300? 2024-11-19T01:25:25Z Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XII Characterization ent://SD_ILS/0/SD_ILS:188565 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85039-7">http://dx.doi.org/10.1007/978-3-540-85039-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:184525 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Tomitori, Masahiko. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanotechnology ent://SD_ILS/0/SD_ILS:268340 2024-11-19T01:25:25Z 2024-11-19T01:25:25Z Author&#160;Schmid, G&uuml;nter, 1937-<br/>Preferred Shelf Number&#160;T174.7 N3731 2008-<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/>