Search Results for Grasser, Tibor.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dGrasser$00252C$002bTibor.$0026te$003dILS$0026ps$003d300?
2024-09-27T11:21:55Z
Organic Electronics
ent://SD_ILS/0/SD_ILS:190981
2024-09-27T11:21:55Z
2024-09-27T11:21:55Z
Author Grasser, Tibor. editor. Meller, Gregor. editor. Li, Ling. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04538-7">http://dx.doi.org/10.1007/978-3-642-04538-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2024-09-27T11:21:55Z
2024-09-27T11:21:55Z
Author Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Simulation of Semiconductor Processes and Devices 2007 SISPAD 2007
ent://SD_ILS/0/SD_ILS:177019
2024-09-27T11:21:55Z
2024-09-27T11:21:55Z
Author Grasser, Tibor. editor. Selberherr, Siegfried. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-72861-1">http://dx.doi.org/10.1007/978-3-211-72861-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defects in microelectronic materials and devices
ent://SD_ILS/0/SD_ILS:286010
2024-09-27T11:21:55Z
2024-09-27T11:21:55Z
Author Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>