Search Results for Gyvez, Jos&eacute; Pineda de. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dGyvez$00252C$002bJos$0025C3$0025A9$002bPineda$002bde.$0026ps$003d300?dt=list 2024-11-28T09:44:15Z Integrated circuit manufacturability the art of process and design integration ent://SD_ILS/0/SD_ILS:249634 2024-11-28T09:44:15Z 2024-11-28T09:44:15Z Author&#160;Pineda de Gyvez, Jos&eacute;.&#160;Pradhan, Dhiraj K.&#160;IEEE Circuits and Systems Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration ent://SD_ILS/0/SD_ILS:205572 2024-11-28T09:44:15Z 2024-11-28T09:44:15Z Author&#160;Zjajo, Amir. author.&#160;Pineda de Gyvez, Jos&eacute;. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition ent://SD_ILS/0/SD_ILS:166351 2024-11-28T09:44:15Z 2024-11-28T09:44:15Z Author&#160;Sachdev, Manoj. editor.&#160;Gyvez, Jos&eacute; Pineda de. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>