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Mathematical methods in survival analysis, reliability and quality of life
ent://SD_ILS/0/SD_ILS:297543
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Author Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Counting processes and survival analysis
ent://SD_ILS/0/SD_ILS:300344
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Author Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a>
Spis tre?ci <a href="http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html">http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html</a>
ebrary <a href="http://site.ebrary.com/id/10509867">http://site.ebrary.com/id/10509867</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical models and methods for lifetime data
ent://SD_ILS/0/SD_ILS:301856
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Author Lawless, Jerald F., 1944-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical methods for survival data analysis
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Author Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139">http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The statistical analysis of failure time data
ent://SD_ILS/0/SD_ILS:301855
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Author Kalbfleisch, J. D. Prentice, Ross L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a>
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Accelerated testing statistical models, test plans and data analyses
ent://SD_ILS/0/SD_ILS:295259
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Author Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>