Search Results for Hancock, Edwin. - Narrowed by: Computer software.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dHancock$00252C$002bEdwin.$0026qf$003dSUBJECT$002509Subject$002509Computer$002bsoftware.$002509Computer$002bsoftware.$0026ic$003dtrue$0026ps$003d300?
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Similarity-Based Pattern Recognition Second International Workshop, SIMBAD 2013, York, UK, July 3-5, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334736
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Author Hancock, Edwin. editor. Pelillo, Marcello. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334736.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-39140-8">http://dx.doi.org/10.1007/978-3-642-39140-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:192833
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Author Hancock, Edwin R. editor. Wilson, Richard C. editor. Windeatt, Terry. editor. Ulusoy, Ilkay. editor. Escolano, Francisco. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14980-1">http://dx.doi.org/10.1007/978-3-642-14980-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mathematics of Surfaces XIII 13th IMA International Conference York, UK, September 7-9, 2009 Proceedings
ent://SD_ILS/0/SD_ILS:190674
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Author Hancock, Edwin R. editor. Martin, Ralph R. editor. Sabin, Malcolm A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03596-8">http://dx.doi.org/10.1007/978-3-642-03596-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Similarity-Based Pattern Recognition First International Workshop, SIMBAD 2011, Venice, Italy, September 28-30, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195647
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Author Pelillo, Marcello. editor. Hancock, Edwin R. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24471-1">http://dx.doi.org/10.1007/978-3-642-24471-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399034
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Author Bai, Xiao. editor. Hancock, Edwin R. editor. Ho, Tin Kam. editor. Wilson, Richard C. editor. Biggio, Battista. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-97785-0">https://doi.org/10.1007/978-3-319-97785-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR&SPR 2012, Hiroshima, Japan, November 7-9, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197483
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Author Gimel’farb, Georgy. editor. Hancock, Edwin. editor. Imiya, Atsushi. editor. Kuijper, Arjan. editor. Kudo, Mineichi. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-34166-3">http://dx.doi.org/10.1007/978-3-642-34166-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>