Search Results for Hofer, Werner.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dHofer$00252C$002bWerner.$0026ic$003dtrue$0026ps$003d300?
2026-07-22T09:17:46Z
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2026-07-22T09:17:46Z
2026-07-22T09:17:46Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Conductive atomic force microscopy : applications in nanomaterials
ent://SD_ILS/0/SD_ILS:593891
2026-07-22T09:17:46Z
2026-07-22T09:17:46Z
Author Lanza, Mario.<br/>Preferred Shelf Number QH212 .A78<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>