Search Results for IEEE - Narrowed by: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIEEE$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026pe$003dd$00253A$0026ps$003d300? 2025-01-06T08:29:23Z Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Curtis, Peter M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Preferred Shelf Number&#160;ONLINE(365001.1)<br/>Electronic Access&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Bauer, Eric.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2025-01-06T08:29:23Z 2025-01-06T08:29:23Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>