Search Results for IET, - Narrowed by: Testing. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIET$00252C$0026qf$003dSUBJECT$002509Subject$002509Testing.$002509Testing.$0026ps$003d300? 2024-12-05T06:27:16Z Theory and Practice of Modern Antenna Range Measurements ent://SD_ILS/0/SD_ILS:364916 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Parini, Clive&#160;Gregson, Stuart&#160;McCormick, John&#160;Janse van Rensburg, Daniel<br/>Preferred Shelf Number&#160;\(364916.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBEW055E">http://dx.doi.org/10.1049/PBEW055E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Voltage Engineering Testing ent://SD_ILS/0/SD_ILS:247923 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Ryan, Hugh M., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBPO066E">http://dx.doi.org/10.1049/PBPO066E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lean Product Development A manager's guide ent://SD_ILS/0/SD_ILS:247861 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Mynott, Colin<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBMT028E">http://dx.doi.org/10.1049/PBMT028E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach ent://SD_ILS/0/SD_ILS:247757 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Yichuang Sun, ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical Steels for Rotating Machines ent://SD_ILS/0/SD_ILS:247900 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Beckley, Philip<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBPO037E">http://dx.doi.org/10.1049/PBPO037E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Handbook for EMC Testing and Measurement ent://SD_ILS/0/SD_ILS:247769 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Morgan, David<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBEL008E">http://dx.doi.org/10.1049/PBEL008E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spherical Near-field Antenna Measurements ent://SD_ILS/0/SD_ILS:247795 2024-12-05T06:27:16Z 2024-12-05T06:27:16Z Author&#160;Hansen, J. E., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBEW026E">http://dx.doi.org/10.1049/PBEW026E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>