Search Results for IET, - Narrowed by: Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIET$00252C$0026qf$003dSUBJECT$002509Subject$002509Testing.$002509Testing.$0026ps$003d300?2024-12-08T22:57:33ZTheory and Practice of Modern Antenna Range Measurementsent://SD_ILS/0/SD_ILS:3649162024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Parini, Clive Gregson, Stuart McCormick, John Janse van Rensburg, Daniel<br/>Preferred Shelf Number \(364916.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBEW055E">http://dx.doi.org/10.1049/PBEW055E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High Voltage Engineering Testingent://SD_ILS/0/SD_ILS:2479232024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Ryan, Hugh M., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBPO066E">http://dx.doi.org/10.1049/PBPO066E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lean Product Development A manager's guideent://SD_ILS/0/SD_ILS:2478612024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Mynott, Colin<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBMT028E">http://dx.doi.org/10.1049/PBMT028E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electrical Steels for Rotating Machinesent://SD_ILS/0/SD_ILS:2479002024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Beckley, Philip<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBPO037E">http://dx.doi.org/10.1049/PBPO037E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Handbook for EMC Testing and Measurementent://SD_ILS/0/SD_ILS:2477692024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Morgan, David<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBEL008E">http://dx.doi.org/10.1049/PBEL008E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spherical Near-field Antenna Measurementsent://SD_ILS/0/SD_ILS:2477952024-12-08T22:57:33Z2024-12-08T22:57:33ZAuthor Hansen, J. E., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBEW026E">http://dx.doi.org/10.1049/PBEW026E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>