Search Results for Inspection. - Narrowed by: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dInspection.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list 2026-03-31T17:03:51Z Novel Sensors for Food Inspection: Modelling, Fabrication and Experimentation ent://SD_ILS/0/SD_ILS:489382 2026-03-31T17:03:51Z 2026-03-31T17:03:51Z Author&#160;Abdul Rahman, Mohd Syaifudin. author.&#160;Mukhopadhyay, Subhas Chandra. author.&#160;Yu, Pak-Lam. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-04274-9">https://doi.org/10.1007/978-3-319-04274-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analog Microelectronics ent://SD_ILS/0/SD_ILS:609689 2026-03-31T17:03:51Z 2026-03-31T17:03:51Z Author&#160;Borgarino, Mattia. author. (orcid)0000-0001-9678-592X&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-94286-0">https://doi.org/10.1007/978-3-031-94286-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures ent://SD_ILS/0/SD_ILS:605276 2026-03-31T17:03:51Z 2026-03-31T17:03:51Z Author&#160;Li, Wei. author.&#160;Yuan, Xin'an. author.&#160;Zhao, Jianming. author.&#160;Yin, Xiaokang. author.&#160;Li, Xiao. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-97-7255-1">https://doi.org/10.1007/978-981-97-7255-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>