Search Results for Inspection. - Narrowed by: Microelectronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dInspection.$0026qf$003dSUBJECT$002509Subject$002509Microelectronics.$002509Microelectronics.$0026ps$003d300?
2025-12-23T19:15:26Z
Optical inspection of microsystems
ent://SD_ILS/0/SD_ILS:542500
2025-12-23T19:15:26Z
2025-12-23T19:15:26Z
Author Osten, Wolfgang.<br/>Preferred Shelf Number TS156.2 .O652 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Novel Sensors for Food Inspection: Modelling, Fabrication and Experimentation
ent://SD_ILS/0/SD_ILS:489382
2025-12-23T19:15:26Z
2025-12-23T19:15:26Z
Author Abdul Rahman, Mohd Syaifudin. author. Mukhopadhyay, Subhas Chandra. author. Yu, Pak-Lam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-04274-9">https://doi.org/10.1007/978-3-319-04274-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>