Search Results for Inspection. - Narrowed by: Microelectronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dInspection.$0026qf$003dSUBJECT$002509Subject$002509Microelectronics.$002509Microelectronics.$0026te$003dILS$0026ps$003d300?dt=list
2025-01-03T14:02:15Z
Optical inspection of microsystems
ent://SD_ILS/0/SD_ILS:287557
2025-01-03T14:02:15Z
2025-01-03T14:02:15Z
Author Osten, Wolfgang.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420019162">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Novel Sensors for Food Inspection: Modelling, Fabrication and Experimentation
ent://SD_ILS/0/SD_ILS:489382
2025-01-03T14:02:15Z
2025-01-03T14:02:15Z
Author Abdul Rahman, Mohd Syaifudin. author. Mukhopadhyay, Subhas Chandra. author. Yu, Pak-Lam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-04274-9">https://doi.org/10.1007/978-3-319-04274-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>