Search Results for Integrated circuits -- Defects.

Testing for small-delay defects in nanoscale CMOS integrated circuits

2026-01-21T07:44:57Z

Author Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number TK7871.99 .M44 T43 2014
Electronic Access Click here to view.
Format: Books
Availability Online Library~1

Counterfeit Integrated Circuits Detection and Avoidance

2026-01-21T07:44:57Z

Author Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access https://doi.org/10.1007/978-3-319-11824-6
Format: Electronic Resources
Availability Online Library~1

Defects in microelectronic materials and devices

2026-01-21T07:44:57Z

Author Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number TK7871 .D44 2009
Electronic Access Click here to view.
Format: Books
Availability Online Library~1

Probability with R : an introduction with computer science applications

2026-01-21T07:44:57Z

Author Horgan, Jane M., 1947-
Preferred Shelf Number QA76.9 .M35 H863 2009 EB
Electronic Access https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536963
Format: Electronic Resources
Availability Online Library~1

High-speed VLSI interconnections

2026-01-21T07:44:57Z

Author Goel, Ashok K., 1953-
Preferred Shelf Number ONLINE
Electronic Access IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516
Format: Electronic Resources
Availability Online Library~1