Search Results for Integrated circuits -- Defects. - Narrowed by: Electronic Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bDefects.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ps$003d300?
2026-01-21T16:27:08Z
Counterfeit Integrated Circuits Detection and Avoidance
ent://SD_ILS/0/SD_ILS:530174
2026-01-21T16:27:08Z
2026-01-21T16:27:08Z
Author Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High-speed VLSI interconnections
ent://SD_ILS/0/SD_ILS:249510
2026-01-21T16:27:08Z
2026-01-21T16:27:08Z
Author Goel, Ashok K., 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>