Search Results for Integrated circuits -- Defects. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bDefects.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-23T13:34:16Z Testing for small-delay defects in nanoscale CMOS integrated circuits ent://SD_ILS/0/SD_ILS:342881 2024-12-23T13:34:16Z 2024-12-23T13:34:16Z Author&#160;Goel, Sandeep K, editor of compilation.&#160;Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE(342881.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects in microelectronic materials and devices ent://SD_ILS/0/SD_ILS:286010 2024-12-23T13:34:16Z 2024-12-23T13:34:16Z Author&#160;Fleetwood, Daniel.&#160;Pantelides, Sokrates T.&#160;Schrimpf, Ronald Donald.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High-speed VLSI interconnections ent://SD_ILS/0/SD_ILS:249510 2024-12-23T13:34:16Z 2024-12-23T13:34:16Z Author&#160;Goel, Ashok K., 1953-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>