Search Results for Integrated circuits -- Defects.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bDefects.$0026te$003dILS$0026ps$003d300?dt=list2024-12-23T13:34:16ZTesting for small-delay defects in nanoscale CMOS integrated circuitsent://SD_ILS/0/SD_ILS:3428812024-12-23T13:34:16Z2024-12-23T13:34:16ZAuthor Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number ONLINE(342881.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-12-23T13:34:16Z2024-12-23T13:34:16ZAuthor Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-speed VLSI interconnectionsent://SD_ILS/0/SD_ILS:2495102024-12-23T13:34:16Z2024-12-23T13:34:16ZAuthor Goel, Ashok K., 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>