Search Results for Integrated circuits -- Reliability. - Narrowed by: Electronic Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bReliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ic$003dtrue$0026ps$003d300? 2024-10-31T05:17:56Z Terrestrial radiation effects in ULSI devices and electronic systems ent://SD_ILS/0/SD_ILS:342252 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Ibe, Eishi H., author.<br/>Preferred Shelf Number&#160;ONLINE(342252.1)<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design ent://SD_ILS/0/SD_ILS:518551 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Fakhfakh, Mourad. editor.&#160;Tlelo-Cuautle, Esteban. editor.&#160;Siarry, Patrick. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(518551.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Green electronics manufacturing creating environmental sensible products ent://SD_ILS/0/SD_ILS:291642 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Wang, John X., 1962-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439826690">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor process reliability in practice ent://SD_ILS/0/SD_ILS:293479 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Gan, Zhenghao.&#160;Wong, Waisum.&#160;Liou, Juin J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ESD failure mechanisms and models ent://SD_ILS/0/SD_ILS:298375 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Voldman, Steven H.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Low-power HF Microelectronics A unified approach ent://SD_ILS/0/SD_ILS:247746 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Machado, Gerson A. S., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronics reliability and measurement technology nondestructive evaluation ent://SD_ILS/0/SD_ILS:254151 2024-10-31T05:17:56Z 2024-10-31T05:17:56Z Author&#160;Heyman, Joseph S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>