Search Results for Integrated circuits -- Testing. - Narrowed by: English
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Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:342881
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Author Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number ONLINE(342881.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
3D IC stacking technology
ent://SD_ILS/0/SD_ILS:293493
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Author Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/3d-ic-stacking-technology">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System-on-chip test architectures nanometer design for testability
ent://SD_ILS/0/SD_ILS:148557
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Author Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
ent://SD_ILS/0/SD_ILS:247757
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Author Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital integrated circuits : design-for-test using Simulink and Stateflow
ent://SD_ILS/0/SD_ILS:109724
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Author Perelroyzen, Evgeni.<br/>Preferred Shelf Number TK7874 .P445 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
The VLSI handbook
ent://SD_ILS/0/SD_ILS:289331
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Author Chen, Wai-Kai, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI test principles and architectures design for testability
ent://SD_ILS/0/SD_ILS:253779
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Author Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
ent://SD_ILS/0/SD_ILS:392732
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Author Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Preferred Shelf Number TK7874.75 B87 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
VLSI Testing Digital and mixed analogue/digital techniques
ent://SD_ILS/0/SD_ILS:247747
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Author Hurst, Stanley L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS009E">http://dx.doi.org/10.1049/PBCS009E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Low-power HF Microelectronics A unified approach
ent://SD_ILS/0/SD_ILS:247746
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Author Machado, Gerson A. S., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
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Author Afshar, Amir.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Algorithmic and Knowledge-based CAD for VLSI
ent://SD_ILS/0/SD_ILS:247743
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Author Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
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Author Wang, Francis C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
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Author Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>