Search Results for Integrated circuits -- Testing. - Narrowed by: 2008SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bTesting.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092008$0025092008$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-11-11T22:49:43ZSystem-on-chip test architectures nanometer design for testabilityent://SD_ILS/0/SD_ILS:1485572024-11-11T22:49:43Z2024-11-11T22:49:43ZAuthor Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>RF measurements for cellular phones and wireless data systemsent://SD_ILS/0/SD_ILS:2495462024-11-11T22:49:43Z2024-11-11T22:49:43ZAuthor Scott, Allan W. Frobenius, Rex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572024-11-11T22:49:43Z2024-11-11T22:49:43ZAuthor Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>