Search Results for Integrated circuits -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bTesting.$0026te$003dILS$0026ps$003d300?dt=list2024-06-03T12:51:40ZTesting for small-delay defects in nanoscale CMOS integrated circuitsent://SD_ILS/0/SD_ILS:3428812024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number ONLINE(342881.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>3D IC stacking technologyent://SD_ILS/0/SD_ILS:2934932024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/3d-ic-stacking-technology">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>ESD failure mechanisms and modelsent://SD_ILS/0/SD_ILS:2983752024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>RF measurements for cellular phones and wireless data systemsent://SD_ILS/0/SD_ILS:2495462024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Scott, Allan W. Frobenius, Rex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System-on-chip test architectures nanometer design for testabilityent://SD_ILS/0/SD_ILS:1485572024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The VLSI handbookent://SD_ILS/0/SD_ILS:2893312024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Chen, Wai-Kai, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital integrated circuits : design-for-test using Simulink and Stateflowent://SD_ILS/0/SD_ILS:1097242024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Perelroyzen, Evgeni.<br/>Preferred Shelf Number TK7874 .P445 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>VLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsent://SD_ILS/0/SD_ILS:3927322024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Preferred Shelf Number TK7874.75 B87 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Integrated circuit manufacturability the art of process and design integrationent://SD_ILS/0/SD_ILS:2496342024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Testing Digital and mixed analogue/digital techniquesent://SD_ILS/0/SD_ILS:2477472024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Hurst, Stanley L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS009E">http://dx.doi.org/10.1049/PBCS009E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Low-power HF Microelectronics A unified approachent://SD_ILS/0/SD_ILS:2477462024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Machado, Gerson A. S., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles of semiconductor network testingent://SD_ILS/0/SD_ILS:2543282024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Afshar, Amir.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Algorithmic and Knowledge-based CAD for VLSIent://SD_ILS/0/SD_ILS:2477432024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital circuit testing a guide to DFT and other techniquesent://SD_ILS/0/SD_ILS:2552342024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Wang, Francis C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital systems testing and testable designent://SD_ILS/0/SD_ILS:2495852024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronics reliability and measurement technology nondestructive evaluationent://SD_ILS/0/SD_ILS:2541512024-06-03T12:51:40Z2024-06-03T12:51:40ZAuthor Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>