Search Results for Integrated circuits -- Very large scale integration. - Narrowed by: Wang, Laung-Terng.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bVery$002blarge$002bscale$002bintegration.$0026qf$003dAUTHOR$002509Author$002509Wang$00252C$002bLaung-Terng.$002509Wang$00252C$002bLaung-Terng.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-09-27T00:32:07ZSystem-on-chip test architectures nanometer design for testabilityent://SD_ILS/0/SD_ILS:1485572024-09-27T00:32:07Z2024-09-27T00:32:07ZAuthor Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792024-09-27T00:32:07Z2024-09-27T00:32:07ZAuthor Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>