Search Results for Integrated circuits--Reliability. - Narrowed by: Electronic Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Reliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ps$003d300?dt=list
2026-06-14T13:10:28Z
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
ent://SD_ILS/0/SD_ILS:526856
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-0055-8">https://doi.org/10.1007/978-981-99-0055-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro-Relay Technology for Energy-Efficient Integrated Circuits
ent://SD_ILS/0/SD_ILS:529445
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Kam, Hei. author. Chen, Fred. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-2128-7">https://doi.org/10.1007/978-1-4939-2128-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Terrestrial radiation effects in ULSI devices and electronic systems
ent://SD_ILS/0/SD_ILS:342252
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Ibe, Eishi H., author.<br/>Preferred Shelf Number ONLINE(342252.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
ent://SD_ILS/0/SD_ILS:518551
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Low-power HF Microelectronics A unified approach
ent://SD_ILS/0/SD_ILS:247746
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Machado, Gerson A. S., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2026-06-14T13:10:28Z
2026-06-14T13:10:28Z
Author Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>