Search Results for Integrated circuits--Reliability. - Narrowed by: Processor Architectures.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Reliability.$0026qf$003dSUBJECT$002509Subject$002509Processor$002bArchitectures.$002509Processor$002bArchitectures.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-03-21T16:09:13Z
Fundamentals of Electromigration-Aware Integrated Circuit Design
ent://SD_ILS/0/SD_ILS:607413
2026-03-21T16:09:13Z
2026-03-21T16:09:13Z
Author Lienig, Jens. author. (orcid)0000-0002-2140-4587 Rothe, Susann. author. Thiele, Matthias. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-80023-8">https://doi.org/10.1007/978-3-031-80023-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Carbon Nanotubes for Interconnects Process, Design and Applications
ent://SD_ILS/0/SD_ILS:614055
2026-03-21T16:09:13Z
2026-03-21T16:09:13Z
Author Todri-Sanial, Aida. editor. Dijon, Jean. editor. Maffucci, Antonio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-29746-0">https://doi.org/10.1007/978-3-319-29746-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>