Search Results for Integrated circuits--Testing. - Narrowed by: Wiley E-Book Collection SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AWILEY$002509Wiley$002bE-Book$002bCollection$0026ps$003d300? 2026-02-10T14:29:21Z GaN power devices for efficient power conversion ent://SD_ILS/0/SD_ILS:599373 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Lidow, Alex, author.<br/>Preferred Shelf Number&#160;TK7871.95 .L53 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flexible electronic packaging and encapsulation technology ent://SD_ILS/0/SD_ILS:599071 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Meng, Hong, editor.&#160;Huang, Wei, editor.<br/>Preferred Shelf Number&#160;TK7870.15 .F54 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical ESD protection design ent://SD_ILS/0/SD_ILS:597233 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Wang, Albert Z. H., 1962- author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used ent://SD_ILS/0/SD_ILS:596092 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Domingo, George, 1937- author.<br/>Preferred Shelf Number&#160;TK7871.85 .D66 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of 3D integration. Volume 4, Design, test, and thermal management ent://SD_ILS/0/SD_ILS:595051 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Franzon, Paul D., editor.&#160;Marinissen, Eric Jan, editor.&#160;Bakir, Muhannad S., editor.<br/>Preferred Shelf Number&#160;TK7874.893 .H36 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoelectronics : materials, devices, applications ent://SD_ILS/0/SD_ILS:593621 2026-02-10T14:29:21Z 2026-02-10T14:29:21Z Author&#160;Puers, R., editor.<br/>Preferred Shelf Number&#160;TK7874.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>