Search Results for Integrated circuits--Testing. - Narrowed by: Electrostatics.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dSUBJECT$002509Konu$002509Electrostatics.$002509Electrostatics.$0026ic$003dtrue$0026ps$003d300?
2026-02-09T17:13:25Z
Practical ESD protection design
ent://SD_ILS/0/SD_ILS:597233
2026-02-09T17:13:25Z
2026-02-09T17:13:25Z
Author Wang, Albert Z. H., 1962- author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2026-02-09T17:13:25Z
2026-02-09T17:13:25Z
Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>