Search Results for Integrated circuits--Testing. - Narrowed by: Computer networks .
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dSUBJECT$002509Subject$002509Computer$002bnetworks$0025C2$0025A0.$002509Computer$002bnetworks$0025C2$0025A0.$0026ic$003dtrue$0026ps$003d300?
2026-05-16T14:37:37Z
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605770
2026-05-16T14:37:37Z
2026-05-16T14:37:37Z
Author Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-3756-7">https://doi.org/10.1007/978-981-97-3756-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605599
2026-05-16T14:37:37Z
2026-05-16T14:37:37Z
Author Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-5269-0">https://doi.org/10.1007/978-981-97-5269-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>