Search Results for Integrated circuits--Testing. - Narrowed by: Electronics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300?2026-02-10T08:19:58ZSemiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are usedent://SD_ILS/0/SD_ILS:5960922026-02-10T08:19:58Z2026-02-10T08:19:58ZAuthor Domingo, George, 1937- author.<br/>Preferred Shelf Number TK7871.85 .D66 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of 3D integration. Volume 4, Design, test, and thermal managementent://SD_ILS/0/SD_ILS:5950512026-02-10T08:19:58Z2026-02-10T08:19:58ZAuthor Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Preferred Shelf Number TK7874.893 .H36 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanoelectronics : materials, devices, applicationsent://SD_ILS/0/SD_ILS:5936212026-02-10T08:19:58Z2026-02-10T08:19:58ZAuthor Puers, R., editor.<br/>Preferred Shelf Number TK7874.84<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>