Search Results for Interferometry. - Narrowed by: Interferometry.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dInterferometry.$0026qf$003dSUBJECT$002509Subject$002509Interferometry.$002509Interferometry.$0026te$003dILS$0026ps$003d300?
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Optical interferometry
ent://SD_ILS/0/SD_ILS:254207
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Author Hariharan, P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123116307">http://www.sciencedirect.com/science/book/9780123116307</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atom interferometry
ent://SD_ILS/0/SD_ILS:257403
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Author Berman, Paul R., 1945-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120924608">http://www.sciencedirect.com/science/book/9780120924608</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Basics of interferometry
ent://SD_ILS/0/SD_ILS:111082
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Author Hariharan, P.<br/>Preferred Shelf Number QC411 .H35 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Basics of interferometry
ent://SD_ILS/0/SD_ILS:145180
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Author Hariharan, P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123735898">http://www.sciencedirect.com/science/book/9780123735898</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Basics of interferometry
ent://SD_ILS/0/SD_ILS:258023
2024-11-08T12:01:16Z
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Author Hariharan, P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080918617">http://www.sciencedirect.com/science/book/9780080918617</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Polarisation : applications in remote sensing
ent://SD_ILS/0/SD_ILS:356267
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Author Cloude, Shane.<br/>Preferred Shelf Number QC665.S3 C56 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
ent://SD_ILS/0/SD_ILS:342225
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Author Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Preferred Shelf Number ONLINE(342225.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical shop testing
ent://SD_ILS/0/SD_ILS:296984
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Author Malacara, Daniel, 1937- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470135976">http://dx.doi.org/10.1002/9780470135976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Interferogram analysis for optical testing
ent://SD_ILS/0/SD_ILS:288501
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Author Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>