Search Results for Judgment. - Narrowed by: Wiley E-Book Collection SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dJudgment.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AWILEY$002509Wiley$002bE-Book$002bCollection$0026ps$003d300? 2026-03-07T05:22:13Z The Clinical Encounter A Philosophical Analysis ent://SD_ILS/0/SD_ILS:600397 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Mercuri, Mathew.&#160;Baigrie, Brian S.&#160;Baker, Steven K.<br/>Preferred Shelf Number&#160;XX(600397.1)<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394217908">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394217908</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From ought to is : catalysing change and movement in a polarised world ent://SD_ILS/0/SD_ILS:600062 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Rowland, Deborah author http://id.loc.gov/authorities/names/nb2001038701<br/>Preferred Shelf Number&#160;HD58.8 .R69368 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394265145">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394265145</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of software fault localization : foundations and advances ent://SD_ILS/0/SD_ILS:597865 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Wong, W. Eric, editor.&#160;Tse, T. H., editor.&#160;John Wiley &amp; Sons, publisher.<br/>Preferred Shelf Number&#160;QA76.76 .F34 H36 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119880929">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119880929</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Climate risks : an investor's field guide to identification and assessment ent://SD_ILS/0/SD_ILS:598256 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Buhr, Bob, author.<br/>Preferred Shelf Number&#160;HB615 .B827 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394187348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394187348</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> How to measure anything in cybersecurity risk ent://SD_ILS/0/SD_ILS:598301 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Hubbard, Douglas W., 1962- author.&#160;Seiersen, Richard, 1967- author.<br/>Preferred Shelf Number&#160;HV6773.15 .C97 H835 2023 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119892335">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119892335</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Decision-making tools to support innovation : guidelines and case studies ent://SD_ILS/0/SD_ILS:598492 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Enjolras, Manon, author.&#160;Galvez, Daniel, author.&#160;Camargo, Mauricio, author.<br/>Preferred Shelf Number&#160;HM846 .E55 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394228997">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394228997</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Aesthetics in Digital Photography ent://SD_ILS/0/SD_ILS:598455 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Ma&icirc;tre, Henri, author.<br/>Preferred Shelf Number&#160;TR267 .M35 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225972">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225972</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Corporate cybersecurity : identifying risks and the bug bounty program ent://SD_ILS/0/SD_ILS:596785 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Jackson, John (Cybersecurity professional), author.<br/>Preferred Shelf Number&#160;HD30.38 .J34 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782568">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782568</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Business forecasting : the emerging role of artificial intelligence and machine learning ent://SD_ILS/0/SD_ILS:596561 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Gilliland, Michael, editor.&#160;Tashman, Len, 1942- editor.&#160;Sglavo, Udo, 1968- editor.&#160;John Wiley &amp; Sons, publisher.<br/>Preferred Shelf Number&#160;HD30.27 .B874 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782605">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782605</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A guide to the scientific career : virtues, communication, research and academic writing ent://SD_ILS/0/SD_ILS:595555 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Shoja, Mohammadali M., editor.&#160;Arynchyna, Anastasia, editor.&#160;Loukas, Marios, editor.&#160;D'Antoni, Anthony V., editor.&#160;Buerger, Sandra M., editor.<br/>Preferred Shelf Number&#160;Q147 .G85 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118907283">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118907283</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Production availability and reliability : use in the oil and gas industry ent://SD_ILS/0/SD_ILS:594494 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Leroy, Alain, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Business ethics : an ethical decision-making approach ent://SD_ILS/0/SD_ILS:593411 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Schwartz, Mark S., author.<br/>Preferred Shelf Number&#160;HF5387<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118393390">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118393390</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Foundations of homeland security : law and policy ent://SD_ILS/0/SD_ILS:593115 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Alperen, Martin J., author.<br/>Preferred Shelf Number&#160;KF4850<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289142">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289142</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical intervals : a guide for practitioners and researchers. ent://SD_ILS/0/SD_ILS:593504 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Meeker, William Q.&#160;Hahn, Gerald J.&#160;Escobar, Luis A.<br/>Preferred Shelf Number&#160;QA276 .H22 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118594841">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118594841</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Wiley Blackwell handbook of the psychology of recruitment, selection and employee retention ent://SD_ILS/0/SD_ILS:593211 2026-03-07T05:22:13Z 2026-03-07T05:22:13Z Author&#160;Goldstein, Harold, 1965- editor.&#160;Pulakos, Elaine Diane, editor.&#160;Semedo, Carla, 1973- editor.<br/>Preferred Shelf Number&#160;HF5549.5 .S38<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118972472">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118972472</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>