Search Results for Kaczer, Ben.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dKaczer$00252C$002bBen.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-09-25T11:16:55ZReliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applicationsent://SD_ILS/0/SD_ILS:4892462024-09-25T11:16:55Z2024-09-25T11:16:55ZAuthor Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-09-25T11:16:55Z2024-09-25T11:16:55ZAuthor Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>