Search Results for Kaczer, Ben. - Narrowed by: Online Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dKaczer$00252C$002bBen.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
2024-11-12T09:17:44Z
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2024-11-12T09:17:44Z
2024-11-12T09:17:44Z
Author Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defects in microelectronic materials and devices
ent://SD_ILS/0/SD_ILS:286010
2024-11-12T09:17:44Z
2024-11-12T09:17:44Z
Author Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>